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Study of dynamic effects in microparticle adhesion using Atomic force microscopy

The adhesion and removal of particles from surfaces is a contemporary
problem in many industrial applications like Semiconductor manufacturing,
Bioaerosol removal, Pharmaceuticals, Adhesives and Petroleum industry. The
complexity of the problem is due to the variety of factors like roughness,
temperature, humidity, fluid medium etc. that affect pull-off of particles from
surfaces. In particle removal from surfaces using fluid motion, the dynamic effects
of particle separation will play an important role. Thus it is essential to study the
dynamic effects of particle removal. Velocity of pull-off and force duration effects
are two important dynamic factors that might affect pull-off. Particle adhesion
studies can be made using the Atomic Force Microscope (AFM). The velocity of
pull-off and force duration can be varied while making the AFM measurements.
The objective of the current work is to obtain the dependence of pull-off force on
pull-off velocity. Experiments were conducted using AFM and the data obtained
from the experiments is processed to obtain plots for pull-off force vs. particle size
and pull-off force vs. pull-off velocity. The pull-off force is compared with the predictions of previous contact adhesion theories. A velocity effect on pull-off force
is observed from the experiments conducted.

Identiferoai:union.ndltd.org:tamu.edu/oai:repository.tamu.edu:1969.1/1517
Date17 February 2005
CreatorsKaushik, Anshul
ContributorsSrinivasa, Arun
PublisherTexas A&M University
Source SetsTexas A and M University
Languageen_US
Detected LanguageEnglish
TypeBook, Thesis, Electronic Thesis, text
Format973095 bytes, electronic, application/pdf, born digital

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