To have a useful QCA device it is first necessary to study how to control data flow in a device, then study how temperature and manufacturing defects will affect the proper output of the device. Theoretically a "quantum wire" of perfectly aligned QCA cells at zero Kelvin temperature has been examined. However, QCA processors will not be operating at a temperature of zero Kelvin and inherently the manufacturing process will introduce defects into the system. Many different types of defects could occur at the device level and the individual cell level, both kinds of defects should be examined. Device defects include but are not limited to linear and/or rotational translation, and missing or extra cell(s). The internal cell defects would include an odd sized cell, and one or more miss-sized or dislocated quantum dot(s). These defects may have little effect on the operation of the QCA device, or could cause a complete failure. In addition, the thermal effect on the QCA devices may also cause a failure of the device or system. The defect and thermal operating limit of a QCA device must be determined.In the present investigation, the thermal and defect tolerance of clocked QCA devices will be studied. In order to study tolerance of QCA devices theoretical models will be developed. In particular, some existing computer simulation programs will be studied and expanded. / Department of Physics and Astronomy
| Identifer | oai:union.ndltd.org:BSU/oai:cardinalscholar.bsu.edu:handle/188072 |
| Date | January 2005 |
| Creators | Hendrichsen, Melissa K. |
| Contributors | Khatun, Mahfuza |
| Source Sets | Ball State University |
| Detected Language | English |
| Format | viii, 53 leaves : ill. (some col.) ; 28 cm. |
| Source | Virtual Press |
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