Characterization of planar defects in silicon carbide nanowires

Description

Thesis (Ph.D.)--Texas Christian University, 2010. / Title from dissertation title page (viewed May 4, 2010). Includes abstract. Includes bibliographical references.

Links & Downloads

1. http://etd.tcu.edu/etdfiles/available/etd-04292010-110338/unrestricted/Wieligor.pdf

Tags

Additional Fields

Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/611612293
Date	January 2010
Creators	Wieligor, Monika Katarzyna.
Publisher	[Fort Worth, Tex.] : Texas Christian University,
Source Sets	OCLC
Language	English
Detected Language	English