Return to search

Data fusion of 3D profiles measured by projected fringe profilometry

This paper presents a novel integration technique for segmented 3D profiles measured by projected fringe profilometry. Fringe patterns are projected to the inspected surface. The projected patterns fix their positions relative to the tested object during two segmented measurements. Thus, finding two matched surface points becomes a problem of searching for two identical phases in the fused data sets. This novel integration technique can match images successfully and achieve pixel-to-pixel registration easily even in the presence of geometric deformation, illumination changes, and severe occlusions. It is superior to the other methods because of its:
(1) High matching accuracy;
(2) Improved robustness;
(3) Reduced computational time;
(4) Capability of compensating distortions of the optical system at every
pixel location;
(5) Suitable for images rotating or scaling; and
(6) Suitable for any other projected fringe measurement method.
We also propose a method to design and fabricate a 2-D fringe pattern which can be applied to the integration technique for segmented 3D profiles. Campered with using 1-D fringe patterns for image registration, using a 2-D fringe pattern saves the measurement time and further proveds more tolerence to hand the shadow and noise problems. Tests of the system performance have been carried out that the accuracy of the registration scheme is 5.96% of image pixel size. Therefore, this technique can be extensively used in modern high technology industry. Especially when it requires higher resolution close-up images or overcomes the issue of not every inspected object can be fully expressed just by a single full-field measurement, it is necessary to use this integration technique.

Identiferoai:union.ndltd.org:NSYSU/oai:NSYSU:etd-0708105-163143
Date08 July 2005
CreatorsHsu, Yi-Ling
ContributorsMing-Chi Chou, Wei-Hung Su, Bae-Heng Tseng
PublisherNSYSU
Source SetsNSYSU Electronic Thesis and Dissertation Archive
LanguageCholon
Detected LanguageEnglish
Typetext
Formatapplication/pdf
Sourcehttp://etd.lib.nsysu.edu.tw/ETD-db/ETD-search/view_etd?URN=etd-0708105-163143
Rightsunrestricted, Copyright information available at source archive

Page generated in 0.0019 seconds