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Diffraction Measurements of Residual Macrostress and Microstress Using X-Rays, Synchrotron and Neutrons

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1. http://hdl.handle.net/2237/9178
2. 1344-7912
3. JSME International Journal. Series A, v.47, n.3, 2004, p.252-263

Identifer	oai:union.ndltd.org:NAGOYA/oai:ir.nul.nagoya-u.ac.jp:2237/9178
Date	07 1900
Creators	TANAKA, Keisuke, AKINIWA, Yoshiaki
Publisher	The Japan Society of Mechanical Engineers
Source Sets	Nagoya University
Language	English
Detected Language	English
Type	Article(publisher)
Rights	日本機械学会, 本文データは学協会の許諾に基づきCiNiiから複製したものである。