In this thesis, we analyze the performance of a loop-back built-in-self-test for a RF transceiver front-end. The tests aim at spot defects in a transceiver front-end and they make use of RF specifications such as NF (Noise Figure), G (power gain) and IIP3 (third order Intercept point). To enhance fault detectability, RF signal path sensitization is introduced. We use a functional RF transceiver model that is implemented in MatLab™ to verify this analysis.
| Identifer | oai:union.ndltd.org:UPSALLA1/oai:DiVA.org:liu-2256 |
| Date | January 2004 |
| Creators | Li, Lin |
| Publisher | Linköpings universitet, Institutionen för systemteknik, Institutionen för systemteknik |
| Source Sets | DiVA Archive at Upsalla University |
| Language | English |
| Detected Language | English |
| Type | Student thesis, info:eu-repo/semantics/bachelorThesis, text |
| Format | application/pdf |
| Rights | info:eu-repo/semantics/openAccess |
| Relation | LiTH-ISY-Ex, ; 3525 |
Page generated in 0.0019 seconds