A measurement method for characterizing RFID chip has been proposed that can measure the approximate Read/Write threshold power and impedance of RFID strap with minimum operating procedures; furthermore, the complicated RF facilities are not required. Obtaining the specifications of RFID strap allows designers to estimate maximum read range of designed RFID tag in advance. Therefore, the implemented cost and design cycle times can be reduced substantially. For the verification of the final match condition of assembled RFID tag, a direct measurement technique has been developed, which not only can verify the final impedance match condition of the assembled RFID tags, but can also be used to identify the resistance and reactance mismatch condition between the RFID chip and antenna. The measurement data obtained from the verification method can also be used to estimate the assembly error introduced by different mounting methods. The use of the corrected circuit model of the RFID chip impedance, which includes the assembly error, helps improve the accuracy of the RFID tag design. In the RFID metal tag design, a series of low profile and miniature RFID tags, which is directly attached on metallic objects, has been developed. A series of low cost and easily produced RFID tag antenna structures also has been realized for RFID application on hanging metallic tag, which makes the RFID solution well suited for metallic tag of labeling system that requires integration of RFID technology. The attached RFID metal tag and the metallic RFID hanging tag cover most of the RFID application on steel products in the steel industry.
Identifer | oai:union.ndltd.org:NSYSU/oai:NSYSU:etd-0107110-213134 |
Date | 07 January 2010 |
Creators | Chen, Sung-lin |
Contributors | Kin-Lu Wong, Ken-Huang Lin, Chih-Wen Kuo, Chie-In Lee, Lih-Tyng Hwang, Yu-De Lin, Yi-Cheng Lin, Ming-Cheng Liang |
Publisher | NSYSU |
Source Sets | NSYSU Electronic Thesis and Dissertation Archive |
Language | English |
Detected Language | English |
Type | text |
Format | application/pdf |
Source | http://etd.lib.nsysu.edu.tw/ETD-db/ETD-search/view_etd?URN=etd-0107110-213134 |
Rights | withheld, Copyright information available at source archive |
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