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Measurement driven, electron beam modeling and commissioning for a Monte Carlo treatment planning system with improved accuracy

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Identiferoai:union.ndltd.org:mcgill.ca/oai:escholarship.mcgill.ca:tq57nr88q
Date January 2009
CreatorsThébaut, Jonathan
ContributorsJan Peter Frans Seuntjens (Internal/Cosupervisor2), Francois Deblois (Internal/Supervisor)
PublisherMcGill University
Source SetsMcGill University
Languagehttp://id.loc.gov/vocabulary/iso639-2/eng
Detected LanguageEnglish
TypeThesis
RightsAll items in eScholarship@McGill are protected by copyright with all rights reserved unless otherwise indicated.
RelationPid: 67026

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