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RF compression of electron bunches applied to ultrafast electron diffraction

The dynamics of atomic scale structures during structural change can be studied by Ultrafast Electron Diffraction (UED). The time resolution needed to reveal the fastest dynamics is 100 fs. Sub-angstrom structural resolution becomes possible with 1-1000 pC of charge necessary for diffraction pattern analysis during subtle structural changes. This combination of requirements cannot currently be realized due to the space-charge temporal broadening inherent to bunches of electrons of high fluence and short temporal duration. Simulations show that the incorporation of a specially designed Radio-Frequncy (RF) cavity into the UED apparatus removes this technical limitation. The RF cavity reverses the near linear position-momentum distribution of the temporally broadened electron bunch, causing the bunch to recompress itself as it propagates. It is found that our proposed method allows for sub-100 fs bunches with maximum charge of 0.6 pC, almost 3 orders of magnitude improvement over today's state of the art.

Identiferoai:union.ndltd.org:LACETR/oai:collectionscanada.gc.ca:QMM.111943
Date January 2008
CreatorsChatelain, Robert P., 1982-
PublisherMcGill University
Source SetsLibrary and Archives Canada ETDs Repository / Centre d'archives des thèses électroniques de Bibliothèque et Archives Canada
LanguageEnglish
Detected LanguageEnglish
TypeElectronic Thesis or Dissertation
Formatapplication/pdf
CoverageMaster of Science (Department of Physics.)
RightsAll items in eScholarship@McGill are protected by copyright with all rights reserved unless otherwise indicated.
Relationalephsysno: 003163609, proquestno: AAIMR66907, Theses scanned by UMI/ProQuest.

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