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RF circuit nonlinearity characterization and modeling for embedded test

Thesis (Ph.D.)--University of Florida, 2005. / Title from title page of source document. Document formatted into pages; contains 141 pages. Includes vita. Includes bibliographical references.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/77080099
Date January 2005
CreatorsCho, Choongeol.
Publisher[Gainesville, Fla.] : University of Florida,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish

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