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Joule heat effects on reliability of RF MEMS switches

Thesis (M.S.)--Worcester Polytechnic Institute. / Keywords: thermal effects, MEMS switches, RF switches. Includes bibliographical references (p. 123-127).

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/55066201
Date January 2003
CreatorsMachate, Malgorzata S.
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
SourceLink to electronic thesis.

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