Return to search

Development of ultrathin niobium nitride and niobium titanium nitride films for THz hot-electron bolometers

University, Diss., 2005--Köln.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/180009042
CreatorsBedorf, Sven Holger.
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
TypeOnline-Publikation.

Page generated in 0.002 seconds