The effects of time-dependent electron density fluctuations on a synthesized time domain reflectometry response of a one-dimensional cold plasma sheath are considered. Numerical solutions of the Helmholtz wave equation, which describes the electric field of a normally incident plane wave in a specified static electron density profile, are used. Included in this work is a study of the effects of Doppler shifts resulting from moving density fluctuations in the electron density profile of the sheath. / Master of Science
| Identifer | oai:union.ndltd.org:VTETD/oai:vtechworks.lib.vt.edu:10919/41717 |
| Date | 17 March 2010 |
| Creators | Scherner, Michael J. |
| Contributors | Electrical Engineering |
| Publisher | Virginia Tech |
| Source Sets | Virginia Tech Theses and Dissertation |
| Language | English |
| Detected Language | English |
| Type | Thesis, Text |
| Format | 103 leaves, BTD, application/pdf, application/pdf |
| Rights | In Copyright, http://rightsstatements.org/vocab/InC/1.0/ |
| Relation | OCLC# 25404407, LD5655.V855_1991.S346.pdf |
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