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Relaxation Time Measurements for Collision Processes in the Surface Layers of Conductors and Semiconductors Near 10 Ghz

This thesis represents one phase of a joint effort of research on the properties of liquids and solids. This work is concerned primarily with the microwave properties of solids. In this investigation the properties exhibited by conductor and semiconductor materials when they are subjected to electromagnetic radiation of microwave frequency are studied. The method utilized in this experiment is the perturbation of a resonant cavity produced by introduction of a cylindrically shaped sample into it.

Identiferoai:union.ndltd.org:unt.edu/info:ark/67531/metadc663566
Date12 1900
CreatorsChildress, Larry Wayne
ContributorsRoberts, James Andrew, Harrison, Thomas
PublisherNorth Texas State University
Source SetsUniversity of North Texas
LanguageEnglish
Detected LanguageEnglish
TypeThesis or Dissertation
Formatvi, 65 leaves: ill., Text
RightsPublic, Childress, Larry Wayne, Copyright, Copyright is held by the author, unless otherwise noted. All rights

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