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TEM investigation of contact loading induced phase transformation in silicon /

Thesis (Ph. D.)--Drexel University, 2004. / Includes abstract and vita. Includes bibliographical references (leaves 142-149).

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/56043535
Date January 2004
CreatorsGe, Daibin. Gogotsi, Yury.
PublisherPhiladelphia, Pa. : Drexel University,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
SourceClick for resource

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