The dynamics of Si small point defects and formation of Si extended structures

Description

Thesis (Ph. D.)--Ohio State University, 2005. / Title from first page of PDF file. Document formatted into pages; contains xix, 133 p.; also includes graphics (some col.). Includes bibliographical references (p. 126-133). Available online via OhioLINK's ETD Center

Links & Downloads

1. http://rave.ohiolink.edu/etdc/view?acc%5Fnum=osu1126900310

Tags

Silicon crystals Semiconductors

Additional Fields

Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/64770720
Date	January 2005
Creators	Du, Yaojun.
Source Sets	OCLC
Language	English
Detected Language	English
Source	Connect to resource