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Excess charge carrier lifetime degradation in silicon as caused by monoenergetic neutron irradiation /

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1. http://rave.ohiolink.edu/etdc/view?acc_num=osu1486638127052232

Identifer	oai:union.ndltd.org:OhioLink/oai:etd.ohiolink.edu:osu1486638127052232
Date	January 1966
Creators	Speers, Robert Ray F.
Publisher	The Ohio State University / OhioLINK
Source Sets	Ohiolink ETDs
Language	English
Detected Language	English
Type	text
Source	http://rave.ohiolink.edu/etdc/view?acc_num=osu1486638127052232
Rights	unrestricted, This thesis or dissertation is protected by copyright: all rights reserved. It may not be copied or redistributed beyond the terms of applicable copyright laws.