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A study of gate dielectrics for wide-bandgap semiconductors GaN & SiC /

Thesis (Ph. D.)--University of Hong Kong, 2007. / Title proper from title frame. Also available in printed format.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/232129926
Date January 2007
CreatorsLin, Limin,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
SourceClick to view the E-thesis via HKUTO

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