Return to search

The fabrication and characterization of ion-implanted germanium-incorporated silicon-carbide diodes and transistors

Thesis (M.C.E.)--University of Delaware, 2006. / Principal faculty advisor: James Kolodzey, Dept. of Electrical and Computer Engineering. Includes bibliographical references.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/81253505
Date January 2006
CreatorsLang, Matthias.
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
SourceAccess to citation, abstract and download form provided by ProQuest Information and Learning Company; downloadable PDF file 1.35 Mb., 102 p.

Page generated in 0.0019 seconds