Quantitative analysis of extended defects at surfaces using low-energy electron diffraction

Description

Thesis (Ph. D.)--University of Wisconsin--Madison, 1981. / Typescript. Vita. Description based on print version record. Includes bibliographical references (leaves 342-350).

Links & Downloads

1. http://catalog.hathitrust.org/api/volumes/oclc/7684768.html

Tags

Surfaces (Physics)

Additional Fields

Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/615683569
Date	January 1900
Creators	Welkie, David Gordon.
Source Sets	OCLC
Language	English
Detected Language	English