A comparison is made between Wald's Sequential Probability Ratio sampling plan, several generalized attributes acceptance sampling plans, and a curtailed single sampling plan.
The evaluation of the plans is based upon a cost function based upon a combination of the Average Sampling Number (ASN) and the variance of an estimator for the proportion of defective items in a lot.
Using a numerical calculation of the defined cost function, the curtailed single sampling plan and also a generalized attributes acceptance sampling plan are shown to be better than Wald's SPR in a number of instances for representative operating characteristics. However, strictly in terms of ASN Wald's SPR is shown to be better.
A computer program is devised which gives a good approximation of the variance of the estimator used for Wald's SPR. / M.S.
| Identifer | oai:union.ndltd.org:VTETD/oai:vtechworks.lib.vt.edu:10919/106013 |
| Date | January 1983 |
| Creators | Shaparenko, Raymond Allen |
| Contributors | Industrial Engineering and Operations Research |
| Publisher | Virginia Polytechnic Institute and State University |
| Source Sets | Virginia Tech Theses and Dissertation |
| Language | English |
| Detected Language | English |
| Type | Thesis, Text |
| Format | iv, 60 leaves, application/pdf, application/pdf |
| Rights | In Copyright, http://rightsstatements.org/vocab/InC/1.0/ |
| Relation | OCLC# 10755146 |
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