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Scanning tunneling microscopy investigations of the N-type LaAlO3/TiO2-SrTiO3 heterostructure

The electronic structure at interface between two insulators LaAlO3 and SrTiO3 has been investigated by using scanning tunneling microscopy and spectroscopy. The atomic-scale interfacial band structure is also demonstrated in the work with the consideration of the tip-induced band bending effect.
Experimental results indicate that the magnitude of the built-in field across LaAlO3 is 0.075¡Ó0.005 V/Å. The band bending on SrTiO3 side at the heterointerface is observed. The band downshift of SrTiO3 side at the interface is 0.1 eV with ~1 nm decay length.

Identiferoai:union.ndltd.org:NSYSU/oai:NSYSU:etd-0722111-102454
Date22 July 2011
CreatorsWang, Wen-Ching
ContributorsHsiung Chou, Chung-Lin Wu, Ya-Ping Chiu, Yi-Chun Chen
PublisherNSYSU
Source SetsNSYSU Electronic Thesis and Dissertation Archive
LanguageCholon
Detected LanguageEnglish
Typetext
Formatapplication/pdf
Sourcehttp://etd.lib.nsysu.edu.tw/ETD-db/ETD-search/view_etd?URN=etd-0722111-102454
Rightswithheld, Copyright information available at source archive

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