Optimization of etching parameters for STM tips and an STM study of SiC (0001) [square root]3 x [square root]3 reconstruction /

Description

Thesis (M. Phil.)--University of Hong Kong, 1999. / Includes bibliographical references (leaves 100-101).

Links & Downloads

1. http://sunzi.lib.hku.hk/hkuto/record.jsp?B20567583

Tags

Scanning tunneling microscopy.

Additional Fields

Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/51346895
Date	January 1998
Creators	Ng, Yee-fai.
Publisher	Hong Kong : University of Hong Kong,
Source Sets	OCLC
Language	English
Detected Language	English
Source	View the Table of Contents & Abstract.