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Transmission electron microscopy of defects and internal fields in GaN structures

No description available.
Identiferoai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:368206
Date January 2001
CreatorsMokhtari, Hossein
PublisherUniversity of Bristol
Source SetsEthos UK
Detected LanguageEnglish
TypeElectronic Thesis or Dissertation

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