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Second harmonic spectroscopy of silicon nanocrystals

Using a novel two-beam technique developed to greatly enhance quadrupolar contributions to the second-order nonlinear polarization, we performed a nonlinear spectroscopic study of silicon nanocrystals implanted in an SiO₂ matrix.

Identiferoai:union.ndltd.org:UTEXAS/oai:repositories.lib.utexas.edu:2152/3531
Date28 August 2008
CreatorsFigliozzi, Peter Christopher, 1972-
ContributorsDowner, Michael Coffin
Source SetsUniversity of Texas
LanguageEnglish
Detected LanguageEnglish
TypeThesis
Formatelectronic
RightsCopyright © is held by the author. Presentation of this material on the Libraries' web site by University Libraries, The University of Texas at Austin was made possible under a limited license grant from the author who has retained all copyrights in the works.

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