This paper investigates noise characteristics of detector preamplifier in electron scanning microscopes. Various preamplifiers are measured and the lowest noise level amplifier with good level of speed is used. Further measurement of individual levels of amplifier is done and proposed the most suitable way how to achieve the total amplification. By detailed measuring of amplifier structure are found all unpleasant factors that affect the image quality. On the basis of these dates amplifier hardware is adjusted, software solutions to improve image quality designed and model control implemented, which directly controls active elements of preamplifier so that noise for given amplification was the lowest and reached required amplification.
| Identifer | oai:union.ndltd.org:nusl.cz/oai:invenio.nusl.cz:221058 |
| Date | January 2014 |
| Creators | Temel, Aleš |
| Contributors | republic, David Novák - FEI Czech, Klusáček, Stanislav |
| Publisher | Vysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií |
| Source Sets | Czech ETDs |
| Language | Czech |
| Detected Language | English |
| Type | info:eu-repo/semantics/masterThesis |
| Rights | info:eu-repo/semantics/restrictedAccess |
Page generated in 0.002 seconds