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Scanning infra-red microscope studies of inhomogeneities in Si and GaAs ingot materials

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1. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.316864

Identifer	oai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:316864
Date	January 1992
Creators	Laczik, Z.
Publisher	University of Oxford
Source Sets	Ethos UK
Detected Language	English
Type	Electronic Thesis or Dissertation