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A new UHV cleavage-evaporation and analysis system for the study of metal-semiconductor contacts /

Thesis (M. Phil.)--University of Hong Kong, 1997. / Includes bibliographical references (leaf 151-152).

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/51353862
Date January 1996
CreatorsXu, Xiaoliang.
PublisherHong Kong : University of Hong Kong,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
SourceView the Table of Contents & Abstract.

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