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A DLTS system for semiconductor characterization: application to Ar+ implanted Sb/Si system.

by Siu-Chung Wong. / Thesis (M.Phil.)--Chinese University of Hong Kong, 1988. / Bibliography: leaves 98-102.

Identiferoai:union.ndltd.org:cuhk.edu.hk/oai:cuhk-dr:cuhk_318413
Date January 1988
ContributorsWong, Siu-Chung., Chinese University of Hong Kong Graduate School. Division of Electronics.
PublisherChinese University of Hong Kong
Source SetsThe Chinese University of Hong Kong
LanguageEnglish
Detected LanguageEnglish
TypeText, bibliography
Formatprint, iii, 103, [8] leaves : ill. ; 30 cm.
RightsUse of this resource is governed by the terms and conditions of the Creative Commons “Attribution-NonCommercial-NoDerivatives 4.0 International” License (http://creativecommons.org/licenses/by-nc-nd/4.0/)

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