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Comparison of analytic and numerical models with commercially available simulation tools for the prediction of semiconductor freeze-out and exhaustion /

Thesis (M.S. in Electrical Engineering)--Naval Postgraduate School, September 2002. / Thesis advisor(s): Ron J. Pieper, Sherif N. Michael. Includes bibliographical references (p. 63-64). Also available online.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/51489161
Date January 2002
CreatorsReeves, Derek E.
PublisherMonterey, Calif. : Springfield, Va. : Naval Postgraduate School ; Available from National Technical Information Service,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
Source(461 KB)

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