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Explicit finite element modeling in conjunction with digital image correlation based life prediction of lead-free electronics under shock-impact

Thesis--Auburn University, 2009. / Abstract. Includes bibliographical references (p. 111-121).

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/449869423
Date January 2009
CreatorsShantaram, Sandeep. Lall, Pradeep,
PublisherAuburn, Ala.,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish

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