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Multi-level modeling of total ionizing dose in a-SiO₂ first principles to circuits /

Thesis (Ph. D. in Electrical Engineering)--Vanderbilt University, Aug. 2003. / Title from title screen. Includes bibliographical references.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/53351761
Date January 2003
CreatorsNicklaw, Christopher J.
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
TypeElectronic dissertations.

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