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Single event upset mechanisms for low-energy-deposition events in SiGe HBTs

Thesis (M.S. in Electrical Engineering)--Vanderbilt University, Dec. 2007. / Title from title screen. Includes bibliographical references.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/190865762
Date January 2007
CreatorsMontes, Enrique J.
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
TypeElectronic dissertations.

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