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Nitrogen and hydrogen induced trap passivation at the SiO₂/4H-SiC interface

Thesis (Ph. D. in Interdisciplinary Materials Science)--Vanderbilt University, May 2005. / Title from title screen. Includes bibliographical references.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/58601336
Date January 2005
CreatorsDhar, Sarit.
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
TypeElectronic dissertations.

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