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Electronic properties and reliability of the SiO₂/SiC interface

Thesis (Ph. D. in Interdisciplinary Materials Science)--Vanderbilt University, May 2008. / Title from title screen. Includes bibliographical references.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/226351657
Date January 1900
CreatorsRozen, John.
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
TypeElectronic dissertations.

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