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Characterization of planar defects in silicon carbide nanowires

Thesis (Ph.D.)--Texas Christian University, 2010. / Title from dissertation title page (viewed May 4, 2010). Includes abstract. Includes bibliographical references.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/611612293
Date January 2010
CreatorsWieligor, Monika Katarzyna.
Publisher[Fort Worth, Tex.] : Texas Christian University,
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish

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