Characterization of Pt-H related defects in Si and intrinsic defects in ZnTe via optical and magnetic resonance methods /

Description

Thesis (Ph. D.)--Lehigh University, 1998. / Includes vita. Includes bibliographical references.

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Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/40278590
Date	January 1998
Creators	Uftring, Stephen John,
Source Sets	OCLC
Language	English
Detected Language	English
Type	Academic dissertations