Return to search

Espectrometria de raios-x com diodos de Si

Made available in DSpace on 2014-10-09T12:44:12Z (GMT). No. of bitstreams: 0 / Made available in DSpace on 2014-10-09T14:06:56Z (GMT). No. of bitstreams: 1
06889.pdf: 2660879 bytes, checksum: 1ad6cb9abd7b6c1a92d40f0b7cb82b55 (MD5) / Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP) / Dissertacao (Mestrado) / IPEN/D / Instituto de Pesquisas Energeticas e Nucleares - IPEN/CNEN-SP / FAPESP:97/12485-4

Identiferoai:union.ndltd.org:IBICT/oai:10.40.40.102:123456789/10807
Date09 October 2014
CreatorsMAGALHAES, RODRIGO R. de
ContributorsOrientador: Carmem Cecilia Bueno Tobias
Source SetsIBICT Brazilian ETDs
Detected LanguagePortuguese
Typeinfo:eu-repo/semantics/publishedVersion, info:eu-repo/semantics/masterThesis
Format79
Sourcereponame:Repositório Institucional do IPEN, instname:Instituto de Pesquisas Energéticas e Nucleares, instacron:IPEN
CoverageN
Rightsinfo:eu-repo/semantics/openAccess

Page generated in 0.0019 seconds