Measurement of the Young's modulus of hexoloy silicon carbide thin films using nanoindentation

Description

Thesis (M.Eng.). / Written for the Dept. of Mechanical Engineering. Title from title page of PDF (viewed 2008/01/14). Includes bibliographical references.

Links & Downloads

1. http://digitool.Library.McGill.CA:8881/R/?func=dbin-jump-full&object_id=18414

Tags

Additional Fields

Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/316024640
Date	January 1900
Creators	Crocker, Janina.
Source Sets	OCLC
Language	English
Detected Language	English