The thesis is aimed at the characterization of carbon nanotubes and silver nanowires by Scanning Probe Microscopy, namely Scanning Tunneling Microscopy (STM), Atomic Force Microscopy (AFM), Conductive AFM (CAFM) and Scanning Near-Field Optical Microscopy (SNOM). Carbon nanotubes were analyzed by STM, AFM and CAFM microscopy. In a designed apparatus the silver nanowires were fabricated by template assisted deposition and were analyzed with respect to their geometry (AFM), local conductivity (CAFM) and optical properties (SNOM, microreflex spectroscopy). It was found that preferential type of carbon nanowires depends on the fabrication process. The measurements of local conductivity of the nanotubes revealed the similarity with the STM measurements. The AFM measurements of silver nanowires confirmed their growth inside the pores of polycarbonate template. Single nanowires exhibits the semiconducting behavior according to I--V measurement and localized plasmon resonances.
| Identifer | oai:union.ndltd.org:nusl.cz/oai:invenio.nusl.cz:233924 |
| Date | January 2010 |
| Creators | Škoda, David |
| Contributors | Čech, Vladimír, Pavlík, Jaroslav, Dub, Petr |
| Publisher | Vysoké učení technické v Brně. Fakulta strojního inženýrství |
| Source Sets | Czech ETDs |
| Language | Czech |
| Detected Language | English |
| Type | info:eu-repo/semantics/doctoralThesis |
| Rights | info:eu-repo/semantics/restrictedAccess |
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