The high-radiation environment in space can lead to anomalies in normal satellite operation. A major cause of concern to spacecraft-designers is the single event upset (SEU). SEUs can result in deviations from expected component behavior and are capable of causing irreversible damage to hardware. In particular, Field Programmable Gate Arrays (FPGAs) are known to be highly susceptible to SEUs. Radiation-hardened versions of such devices are associated with an increase in power consumption and cost in addition to being technologically inferior when compared to contemporary commercial-off-the-shelf (COTS) parts. This thesis consequently aims at exploring the option of using COTS FPGAs in satellite payloads. A framework is developed, allowing the SEU susceptibility of such a device to be studied. SEU testing is carried out in a software-simulated fault environment using a set of Java classes called JBits. A radiation detector module, to measure the radiation backdrop of the device, is also envisioned as part of the final design implementation.
| Identifer | oai:union.ndltd.org:uky.edu/oai:uknowledge.uky.edu:gradschool_theses-1515 |
| Date | 01 January 2008 |
| Creators | Ambat, Shadab Gopinath |
| Publisher | UKnowledge |
| Source Sets | University of Kentucky |
| Detected Language | English |
| Type | text |
| Format | application/pdf |
| Source | University of Kentucky Master's Theses |
Page generated in 0.0021 seconds