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Error rate and power dissipation in nano-logic devices

Current-controlled logic and single electron logic processors have been investigated with respect to thermal-induced bit error. A maximal error rate for both logic processors is regarded as one bit-error/year/chip. A maximal clock frequency and an information channel capacity at a given operation current are derived when a current-controlled logic processor works without error. An available operation range in a current-controlled processor with 100 million elements is discussed. The dependence of an error-free condition on temperature in single electron logic processors is derived. The size of the quantum dot of single electron transistor is predicted when a single electron logic processor with the a billion single electron transistors works without error at room temperature.

Identiferoai:union.ndltd.org:tamu.edu/oai:repository.tamu.edu:1969.1/2224
Date29 August 2005
CreatorsKim, Jong Un
ContributorsKish, Laszlo B.
PublisherTexas A&M University
Source SetsTexas A and M University
Languageen_US
Detected LanguageEnglish
TypeBook, Thesis, Electronic Thesis, text
Format375771 bytes, electronic, application/pdf, born digital

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