If a physical dimension of a metallic specimen is comparable with, or smaller than, the mean free path of the conduction electrons, then the observed electrical conductivity will be less than that of a conventional bulk sample. This phenomenon is called a size effect, and is the result of electron scattering from the specimen surfaces. In the present investigation, measurements were made on electropolished monocrystalline specimens ranging from matchbox geometry to thick-film geometry in order to obtain further information on the size effect in bismuth at liquid helium temperatures.
| Identifer | oai:union.ndltd.org:unt.edu/info:ark/67531/metadc130880 |
| Date | 08 1900 |
| Creators | Vaughn, Bobby J. |
| Contributors | Mackey, H. J., Bilyeu, Russell Gene |
| Publisher | North Texas State University |
| Source Sets | University of North Texas |
| Language | English |
| Detected Language | English |
| Type | Thesis or Dissertation |
| Format | v, 45 leaves : ill., Text |
| Rights | Public, Copyright, Copyright is held by the author, unless otherwise noted. All rights reserved., Vaughn, Bobby J. |
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