Return to search

Fatigue behavior of sub-micron silver and copper films

Zugl.: Stuttgart, Univ., Diss., 2001.

Identiferoai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/314298950
Date January 2001
CreatorsSchwaiger, Ruth.
Publisher[S.l. : s.n.],
Source SetsOCLC
LanguageEnglish
Detected LanguageEnglish
TypeOnline-Publikation.

Page generated in 0.0014 seconds