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Effect of rate-limited interfacial tension reductions on the displacement of residual NAPLs during surfactant flushing

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1. http://hdl.handle.net/1853/19280
2. 462951

Identifer	oai:union.ndltd.org:GATECH/oai:smartech.gatech.edu:1853/19280
Date	12 1900
Creators	Loverde, Laura Elizabeth
Publisher	Georgia Institute of Technology
Source Sets	Georgia Tech Electronic Thesis and Dissertation Archive
Detected Language	English
Type	Thesis
Rights	Access restricted to authorized Georgia Tech users only.