This master thesis discuss about ionizing radiation, interaction with matter and effects on her. In the work is discussed differend types of interactions of directly ionizing radiation and indirectly ionizing radiation. Below is an overview of methods of shielding from all of types of ionizing radiation. Second part of this thesis discuss about single event effects in semiconductors which are cause by ionizing radiation. At the end is described design of measuring instrument included FPGA chips. This design is discused both from point of wiew hardware and software too.
| Identifer | oai:union.ndltd.org:nusl.cz/oai:invenio.nusl.cz:376907 |
| Date | January 2018 |
| Creators | Golubev, Martin |
| Contributors | Hobst, Leonard, Katovský, Karel |
| Publisher | Vysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií |
| Source Sets | Czech ETDs |
| Language | Czech |
| Detected Language | English |
| Type | info:eu-repo/semantics/masterThesis |
| Rights | info:eu-repo/semantics/restrictedAccess |
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