Application of artificial neural networks to predict defect levels in wave soldering processes

Description

Thesis (M.S.)--State University of New York at Binghamton, Dept. of Systems Science and Industrial Engineering, 2007. / Includes bibliographical references.

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1. http://proxy.binghamton.edu/login?url= http://wwwlib.umi.com/dissertations/fullcit/1447465

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Additional Fields

Identifer	oai:union.ndltd.org:OCLC/oai:xtcat.oclc.org:OCLCNo/307713954
Date	January 2007
Creators	Samant, Purnanand G.
Source Sets	OCLC
Language	English
Detected Language	English
Type	Web sites. Electronic dissertations.
Source	Online access via UMI: