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Characterisation of traps in GaAs MESFETs by low frequency noise, gM dispersion and oscillations methods

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1. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.315539

Identifer	oai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:315539
Date	January 1991
Creators	Abdala, Mohammed Ahmed
Publisher	Lancaster University
Source Sets	Ethos UK
Detected Language	English
Type	Electronic Thesis or Dissertation