Return to search

Neutron reflectivity : a technique for the characterisation of two-dimensional semiconductor structures

No description available.
Identiferoai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:329079
Date January 1989
CreatorsAshworth, Clive D.
PublisherUniversity of Reading
Source SetsEthos UK
Detected LanguageEnglish
TypeElectronic Thesis or Dissertation

Page generated in 0.0018 seconds