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Neutron reflectivity : a technique for the characterisation of two-dimensional semiconductor structures

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Identiferoai:union.ndltd.org:bl.uk/oai:ethos.bl.uk:329079
Date January 1989
CreatorsAshworth, Clive D.
PublisherUniversity of Reading
Source SetsEthos UK
Detected LanguageEnglish
TypeElectronic Thesis or Dissertation

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